BOOKS - SCIENCE AND STUDY - Растровая электронная микроск�...
US $6.67
943005
943005
Растровая электронная микроскопия для нанотехнологий. Методы и применение
Author: под ред. У. Жу, Ж. Л. Уанга
Year: 2017 - 3-е изд.
Format: PDF OCR
File size: 22 MB
Language: RU
Year: 2017 - 3-е изд.
Format: PDF OCR
File size: 22 MB
Language: RU
The book, edited by well-known scientists, contains articles and reviews by prominent specialists in the field of nanotechnology on raster electron microscopy (REM). With the help of SEM, it is possible to study the properties of nanoparticles, nanowires, nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic crystals and biological nanostructures. Various types of SEM are considered, including high-resolution transmission microscopes, X-ray microanalysis, the latest methods for imaging by means of backscattered electrons, as well as electron cryomicroscopy methods for the study of biological objects. The book is intended for a wide range of practical specialists in the field of nanotechnology, but it will also be useful for university students and developers of new types of raster electron microscopes.