The tutorial deals with the degradation of semiconductor devices and integrated circuits due to defects formed when exposed to space radiation. The following issues were considered: radiation conditions in space; effect of radiation-induced structural damage on semiconductor properties; degradation of silicon devices and microcircuits due to radiation effects when exposed to ionizing radiation from outer space; the effect of radiation-induced structural damage on the degradation of optoelectronic products; peculiarities of testing electronic equipment and radioelectronic equipment for resistance to ionising radiation from outer space.