BOOKS - TECHNICAL SCIENCES - Кристаллография, рентгенография и электронная микроскопи...
US $6.87
249004
249004
Кристаллография, рентгенография и электронная микроскопия
Author: Уманский Я.С., Скаков Ю.А. и др.
Year: 1982
Format: PDF/DJVU
File size: 52 MB
Language: RU
Year: 1982
Format: PDF/DJVU
File size: 52 MB
Language: RU
Information on crystallography necessary for the use of diffraction methods is given. Theoretical foundations and practical use of X-ray, electron and neutron diffraction for studying the structure of crystals and metallic materials are considered. Principles and application of transmission, diffraction and scanning electron microscopy are described. Methods of local elemental analysis based on various types of interaction of fast electrons with matter are described.