BOOKS - TECHNICAL SCIENCES - Методы исследования полупроводников...
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809042
809042
Методы исследования полупроводников
Author: Воробьев Ю.В., Добровольский В.Н., Стриха В.И.
Year: 1988
Number of pages: 233
Format: PDF
File size: 11,4 MB
Language: RU
Year: 1988
Number of pages: 233
Format: PDF
File size: 11,4 MB
Language: RU
The tutorial describes methods for determining the main parameters of semiconductor materials (resistivity, concentration and mobility of charge carriers, thermal, thermoelectric and recombination parameters, as well as parameters characterizing the semiconductor surface).